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Structural, electrical, and optical properties of Zn-In-Sn-O films for silicon heterojunction solar cells
被引:2
|作者:
Lee, Seunghun
[1
]
Ji, Kwang-Sun
[1
,2
]
Park, Hyomin
[1
]
Tark, Sung Ju
[1
]
Park, Sungeun
[1
]
Lee, Jeong Chul
[3
]
Kim, Won Mok
[4
]
Kang, Yoonmook
[5
]
Lee, Hae-Seok
[1
]
Kim, Donghwan
[1
]
机构:
[1] Korea Univ, Dept Mat Sci & Engn, Seoul 136713, South Korea
[2] LG Elect Adv Res Inst, Solar Energy Grp, Devices & Mat Lab, Seoul 137724, South Korea
[3] Korea Inst Energy Res, KIER UNIST Adv Ctr Energy, Ulsan 689798, South Korea
[4] Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
[5] Korea Univ, Grad Sch Energy & Environm, KU KIST GREEN Sch, Seoul 136713, South Korea
来源:
关键词:
Zinc indium tin oxide;
Magnetron sputtering;
Transparent conducting oxide;
Silicon solar cell;
OXIDE THIN-FILMS;
TRANSPARENT;
D O I:
10.1016/j.tsf.2015.05.025
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We investigated the structural, optical, and electrical properties of Zn-In-Sn-O (ZITO) films prepared by RF magnetron sputtering for silicon heterojunction solar cells. The effects of Zn addition on the properties of the as-grown films were examined. XRD patterns of the ZITO films deposited at room temperature showed a broad peak. The cross-sectional TEM image of ZITO films at low Zn levels exhibited a typical fine or nanostructure embedded in an amorphous phase. On the other hand, at higher Zn addition, the films exhibited a completely amorphous phase. The carrier concentration decreased with increasing Zn content. The lowest electrical resistivity of 5.5 x 10(-4) Omega cm was observed for a ZITO film with 4.83 Zn at.%. All ZITO films grown in this study showed transmittance of over 80% in the visible and near-infrared spectral range. The absorption was less than 5% in the visible region. (C) 2015 Elsevier B.V. All rights reserved.
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页码:233 / 237
页数:5
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