Extended depth of focus in a particle field measurement using a single-shot digital hologram

被引:43
作者
Chen, Wen [1 ]
Quan, Chenggen [1 ]
Tay, Cho Jui [1 ]
机构
[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore
关键词
edge detection; entropy; focal planes; holographic interferometry; optical focusing; wavelet transforms; MICROSCOPY;
D O I
10.1063/1.3263141
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a method to extend the depth of focus in a particle field measurement using a single-shot digital hologram. A focal plane is obtained for each pixel based on an entropy method, and a depth map is subsequently extracted. A synthesized extended focused image is determined correspondingly using the extracted depth map. In addition, a wavelet modulus maxima algorithm and Canny algorithm are further employed to detect the edges of each particle, and the sizes and a three-dimensional localization of the particles are also estimated. Preliminary results are presented to show the feasibility and effectiveness of the proposed technique.
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页数:3
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