Measurements and modelling of pattern-dependent BER and jitter in reshaping optoelectronic repeaters

被引：7
作者：
Öhlén, P [1 ]
Berglind, E [1 ]
机构：
[1] Royal Inst Technol, Dept Elect, S-16440 Kista, Sweden
来源：
IEE PROCEEDINGS-OPTOELECTRONICS | 2000年 / 147卷 / 02期
关键词：
D O I：
10.1049/ip-opt:20000289
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A reshaping optoelectronic repeater is investigated in a loop experiment. If such a device is used in an optical network, the jitter accumulation and its influence on the cascadability are important issues. Whereas the RMS jitter was fairly independent for PRBS patterns, the bit-error rate showed a large pattern dependence. In order to explain these results, a simplified model of the repeater is used, where the device is modelled as a filter followed by an ideal limiter.
引用
收藏
页码：97 / 103
页数：7
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