Measurement of complex permeability of ferromagnetic nanowires using cavity perturbation techniques

被引:0
作者
Sklyuyev, A. [1 ]
Ciureanu, M. [2 ]
Akyel, C. [1 ]
Ciureanu, P. [2 ]
Menard, D. [2 ]
Yelon, A. [2 ]
机构
[1] Ecole Polytech, Dept Genie Elec, CP 6079,Succ Ctr Ville, Montreal, PQ H3C 3A7, Canada
[2] Ecole Polytech, Dept Genie Phys, Montreal, PQ, Canada
来源
2006 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-5 | 2006年
关键词
cavity perturbation; complex permeability; ferromagnetic nanowire;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The complex permeability of nanowire arrays of different materials was measured at X-band using a cavity perturbation technique. Compared with ferromagnetic films of the same materials, a relatively high permeability with a low loss is obtained Our results indicate that ferromagnetic nanowire arrays have important potential technological applications as magnetodielectrics for microwave devices such as variable attenuators, phase shifters, modulators, stop-band filters and power absorbing terminals.
引用
收藏
页码:2270 / +
页数:2
相关论文
共 9 条
[1]   NEW DEVELOPMENTS ON AUTOMATED-ACTIVE CIRCUITS FOR PERMITTIVITY MEASUREMENTS AT MICROWAVE-FREQUENCIES [J].
AKYEL, C ;
BOSISIO, RG .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :496-504
[2]   MEASUREMENT OF SUSCEPTIBILITY TENSOR IN FERRITES [J].
ARTMAN, JO ;
TANNENWALD, PE .
JOURNAL OF APPLIED PHYSICS, 1955, 26 (09) :1124-1132
[3]  
Bethe H. A., 1943, D1117 CORN U NAT DEF
[4]  
Bevington R., 1969, DATA REDUCTION ERROR
[5]   Microwave properties of metallic nanowires [J].
Goglio, G ;
Pignard, S ;
Radulescu, A ;
Piraux, L ;
Huynen, I ;
Vanhoenacker, D ;
Vander Vorst, A .
APPLIED PHYSICS LETTERS, 1999, 75 (12) :1769-1771
[6]   ON THE THEORY OF FERROMAGNETIC RESONANCE ABSORPTION [J].
KITTEL, C .
PHYSICAL REVIEW, 1948, 73 (02) :155-161
[7]   MEASUREMENT OF DIELECTRIC PARAMETERS AT MICROWAVE-FREQUENCIES BY CAVITY-PERTURBATION TECHNIQUE [J].
PARKASH, A ;
VAID, JK ;
MANSINGH, A .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (09) :791-795
[8]  
Waldron R. A., 1960, P IEE C, V107, P272, DOI DOI 10.1049/PI-C.1960.0041
[9]  
YE Y, IN PRESS IEEE T INST