Internal Inductance Correction for Permittivity Measurements of Planar Transmission Lines

被引：0

作者：

Seiler, Patrick ^{[1
]}

Klein, Bernhard ^{[1
]}

Plettemeier, Dirk ^{[1
]}

机构：

[1] Tech Univ Dresden, SFB HAEC 912, Chair RF & Photon Engn, Dresden, Germany

来源：

2016 INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION (ISAP) | 2016年

关键词：

D O I：

暂无

中图分类号：

TN [电子技术、通信技术];

学科分类号：

0809 ;

摘要：

At ISAP 2014, the authors have shown how measurements of planar transmission lines can be used for the determination of the transmission line's propagation constant as well as substrate permittivity. The work presented in this paper extends the previously presented method to also give a correction for internal inductance related to skin depth and surface roughness. Measurement data for microstrip and grounded coplanar waveguide up to 50 GHz is given and shows good agreement after correction. Small deviations due to nickel plating of the lines are discussed and an estimation for the effective relative permeability of the plating is given.

引用

页码：732 / 733

页数：2

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