A distributed charge storage with GeO2 nanodots

被引：43

作者：

Chang, TC ^{[1
]}

Yan, ST

Hsu, CH

Tang, MT

Lee, JF

Tai, YH

Liu, PT

Sze, SM

机构：

[1] Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung, Taiwan

[2] Natl Sun Yat Sen Univ, Inst Electroopt Engn, Kaohsiung 80424, Taiwan

[3] Natl Sun Yat Sen Univ, Ctr Nanosci & Nanotechnol, Kaohsiung 804, Taiwan

[4] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30039, Taiwan

[5] Natl Synchrotron Radiat Res Ctr, Hsinchu 300, Taiwan

[6] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu, Taiwan

[7] Natl Nano Device Lab, Hsinchu 300, Taiwan

来源：

APPLIED PHYSICS LETTERS | 2004年 / 84卷 / 14期

关键词：

D O I：

10.1063/1.1697627

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this study, a distributed charge storage with GeO2 nanodots is demonstrated. The mean size and aerial density of the nanodots embedded in SiO2 are estimated to be about 5.5 nm and 4.3x10(11) cm(-2), respectively. The composition of the dots is also confirmed to be GeO2 by x-ray absorption near-edge structure analyses. A significant memory effect is observed through the electrical measurements. Under the low voltage operation of 5 V, the memory window is estimated to similar to0.45 V. Also, a physical model is proposed to demonstrate the charge storage effect through the interfacial traps of GeO2 nanodots. (C) 2004 American Institute of Physics.

引用

页码：2581 / 2583

页数：3

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