Measuring the spatial deformation of a liquid-crystal on silicon display with a self-interference effect

被引:6
作者
Marco, David [1 ]
Vargas, Asticio [2 ]
del Mar Sanchez-Lopez, Maria [1 ,3 ]
Moreno, Ignacio [1 ,4 ]
机构
[1] Univ Miguel Hernandez Elche, Inst Bioingn, Elche 03202, Spain
[2] Univ La Frontera, Dept Ciencias Fis, Temuco, Chile
[3] Univ Miguel Hernandez Elche, Dept Fis Aplicada, Elche 03202, Spain
[4] Univ Miguel Hernandez Elche, Dept Ciencia Mat Opt & Tecnol Elect, Elche 03202, Spain
关键词
PHASE CALIBRATION; NONUNIFORMITY; COMPENSATION;
D O I
10.1364/OL.396105
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a simple technique to characterize the spatial non-uniformity of a liquid-crystal on silicon (LCOS) spatial light modulator (SLM). It is based on illuminating the display with a wavelength out of the operation range, so there is a significant reflection at the output surface. As a consequence, a Gires-Tournois interferometer is directly created, without any alignment requirement and insensitive to vibrations. The beam reflected at the output surface is the reference beam, while the beam reflected at the silicon backplane is modulated with the addressed gray level in order to quantitatively derive its deformation. We provide an experimental demonstration using a LCOS-SLM designed to operate in the near-infrared range but illuminated with visible light. (C) 2020 Optical Society of America
引用
收藏
页码:4480 / 4483
页数:4
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