Symmetric Distortion Correction in Asphere Manufacturing

被引：1

作者：

Zhang, Jian ^{[1
]}

Dai, Lei ^{[1
]}

机构：

[1] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, State Key Lab Appl Opt, Changchun 130033, Jilin, Peoples R China

来源：

ADVANCES IN OPTICS MANUFACTURE | 2013年 / 552卷

关键词：

symmetric; distortion; correction; aspheric surface;

D O I：

10.4028/www.scientific.net/KEM.552.158

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A method of symmetric distortion correction is described and successfully applied to correct the distortion mapping errors caused by CGH as well as internal imaging optics. The aspheric surface is 160 mm in diameter and has a maximum departure of 145 mu m. According to the model established by the fiducial spots on the aspheric surface, we show experimental results after direct measurement and distortion-corrected error map respectively. The results show that the method of symmetric distortion correction is useful and effective.

引用

页码：158 / 161

页数：4

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