共 6 条
- [1] A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyzer ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY, 2009, 12 (03): : 394 - 401
- [2] ON-WAFER EXPERIMENTAL CHARACTERIZATION FOR A 4-PORT CIRCUIT, USING A TWO-PORT VECTOR NETWORK ANALYZER CAS: 2008 INTERNATIONAL SEMICONDUCTOR CONFERENCE, PROCEEDINGS, 2008, : 223 - +
- [3] On-Wafer Scattering Parameter Characterization of Differential Four-Port Networks LNA using Two-Port Vector Network Analyzer 2014 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE), 2014, : 339 - 342
- [4] Full 2-Port Vector Network Analyzer using Nonlinear Calibration of Six-Port Reflectometer 2019 IEEE MTT-S INTERNATIONAL WIRELESS SYMPOSIUM (IWS 2019), 2019,
- [5] 1 GHz Automatic 2-Port Vector Network Analyzer Using Common Laboratory Instruments 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS, 2014, : 170 - 174
- [6] On-Wafer Single Contact Quadrature Accuracy Measurement Using Receiver Mode in Four-Port Vector Network Analyzer 2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4, 2008, : 370 - +