The oriented growth of zirconia thin films on NaCl (001) surface

被引：11

作者：

Yeh, SW

Huang, HL

Gan, DS ^{[1
]}

Shen, PY

机构：

[1] Natl Sun Yat Sen Univ, Inst Mat Sci & Engn, Kaohsiung 80424, Taiwan

[2] Chinese Mil Acad, Dept Mech Engn, Kaohsiung, Taiwan

来源：

JOURNAL OF CRYSTAL GROWTH | 2006年 / 289卷 / 02期

关键词：

transmission electron microscopy; ion beam sputtering process; nanofilms; sodium chloride; zirconia;

D O I：

10.1016/j.jcrysgro.2005.12.088

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Nanosized cubic and tetragonal ZrO2 were formed as thin nanocrystalline film on NaCl (100) plane by radio frequency ion beam sputtering. The microstructure and the epitaxy relationship with the NaCl (100) plane were studied by a high-resolution transmission electron microscope. The epitaxy orientation was found to be [001](Z)parallel to[001](N), [100](Z)parallel to[110](N) (group A), [011](Z)parallel to[0 0 1](N), [100](Z)parallel to[100](N) (group B-1) and [0 1 1](Z)parallel to[001](N), [100](Z)parallel to[010](N) (group B-2) between zirconia (Z) and NaCl (N). Groups B-1 and B-2 are the dominant type. The possible causes for the epitaxy relationship are discussed. Crystallites within the same group can merge by rotation and coalesce into a single crystal, whereas crystallites in different groups can form high-angle grain boundaries. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：690 / 702

页数：13

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