共 50 条
- [41] TSV Residual Cu Step Height Analysis by White Light Interferometry for 3D Integration 2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2015, : 578 - 584
- [42] Analysis of 3D TSV Vertical Interconnection Using Pre-applied Nonconductive Films Journal of Electronic Materials, 2014, 43 : 4214 - 4223
- [43] Evaluation and Optimization of Thermo-Mechanical Reliability of a TSV-based 3D MEMS 2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 1797 - 1802
- [44] 3D TSV Based High Frequency Components for RF IC and RF MEMS Applications 2016 IEEE INTERNATIONAL 3D SYSTEMS INTEGRATION CONFERENCE (3DIC), 2016,
- [46] Mechanical and Thermal Characterization of TSV Multi-Chip Stacked Packages for Reliable 3D IC Applications 2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 356 - 360
- [47] Full-Chip Multiple TSV-to-TSV Coupling Extraction and Optimization in 3D ICs 2013 50TH ACM / EDAC / IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2013,
- [48] Dummy TSV Based Bit-line Optimization in 3D On-chip Memory 2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRO INFORMATION TECHNOLOGY (EIT), 2016, : 580 - 585
- [49] Material Technology for 2.5D/3D Package IEEE CPMT SYMPOSIUM JAPAN 2015, (ICSJ 2015), 2015, : 101 - 104
- [50] EMI Performance of Power Delivery Networks in 3D TSV Integration PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE, 2016, : 428 - 433