Testing a 32-channel integrated circuit for recording signals of silicon detectors

被引：4

作者：

Atkin, E. V. ^{[1
]}

Volkov, Yu. A. ^{[1
]}

Voronin, A. G. ^{[2
]}

Dement'ev, D. V. ^{[2
]}

Il'yushchenko, I. I. ^{[1
]}

Karmanov, D. E.

Klyuev, A. D. ^{[1
]}

Kudryashov, I. A. ^{[2
]}

Lobanov, A. A. ^{[2
]}

Podorozhnyi, D. M. ^{[2
]}

Shumikhin, V. V. ^{[1
]}

机构：

[1] Natl Res Nucl Univ MEPhI, Moscow 115409, Russia

[2] Moscow MV Lomonosov State Univ, Skobeltsin Res Inst Nucl Phys, Moscow 119992, Russia

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2012年 / 55卷 / 04期

关键词：

Analog Channel; Silicon Detector; Application Specific Inte Grate Circuit; Charge Sensitive Amplifier; Transmission Gain;

D O I：

10.1134/S0020441212030098

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A 32-channel integrated microcircuit for microstrip silicon detectors of the "Nuklon" project for studying ionizing radiation in space conditions is tested. The microcircuit allows one to record signals of relativistic particles and nuclei with a charge from Z = 1 up to Z > 50 from silicon detectors. A structural diagram of the microcircuit and its main experimental characteristics are given. The power consumption does not exceed 1.5 mW/channel, and the dynamic range of recorded signals is not smaller than 100 pC.

引用

页码：456 / 461

页数：6