Microsecond-scale X-ray imaging with Controlled-Drift Detectors

被引：0

作者：

Castoldi, A

Galimberti, A

Guazzoni, C

Rehak, P

Strüder, L

机构：

[1] Politecn Milan, Dip Ingn Nucl CeSNEF, I-20133 Milan, Italy

[2] Ist Nazl Fis Nucl, Sez Milano, I-20133 Milan, Italy

[3] Politecn Milan, Dipartimento Elettron & Informat, I-20133 Milan, Italy

[4] Brookhaven Natl Lab, Upton, NY 11973 USA

[5] MPI Halbleiterlabor, D-81739 Munich, Germany

来源：

NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS | 2006年 / 150卷

关键词：

D O I：

10.1016/j.nuclphysbps.2004.06.005

中图分类号：

O412 [相对论、场论]; O572.2 [粒子物理学];

学科分类号：

摘要：

The Controlled-Drift Detector is a fully-depleted silicon detector that allows 2-D position sensing and energy spectroscopy of X-rays in the range 0.5-20keV with excellent time resolution (few tens of mu s) and limited readout channels. In this paper we review the Controlled-Drift Detector operating principle and we present the X-ray imaging and spectroscopic capabilities of Controlled Drift Detectors in microsecond-scale experiments and the more relevant applications fields.

引用

页码：150 / 154

页数：5

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