Microsecond-scale X-ray imaging with Controlled-Drift Detectors

被引：0
作者：
Castoldi, A
Galimberti, A
Guazzoni, C
Rehak, P
Strüder, L
机构：
[1] Politecn Milan, Dip Ingn Nucl CeSNEF, I-20133 Milan, Italy
[2] Ist Nazl Fis Nucl, Sez Milano, I-20133 Milan, Italy
[3] Politecn Milan, Dipartimento Elettron & Informat, I-20133 Milan, Italy
[4] Brookhaven Natl Lab, Upton, NY 11973 USA
[5] MPI Halbleiterlabor, D-81739 Munich, Germany
来源：
NUCLEAR PHYSICS B-PROCEEDINGS SUPPLEMENTS | 2006年 / 150卷
关键词：
D O I：
10.1016/j.nuclphysbps.2004.06.005
中图分类号：
O412 [相对论、场论]; O572.2 [粒子物理学];
学科分类号：
摘要：
The Controlled-Drift Detector is a fully-depleted silicon detector that allows 2-D position sensing and energy spectroscopy of X-rays in the range 0.5-20keV with excellent time resolution (few tens of mu s) and limited readout channels. In this paper we review the Controlled-Drift Detector operating principle and we present the X-ray imaging and spectroscopic capabilities of Controlled Drift Detectors in microsecond-scale experiments and the more relevant applications fields.
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页码：150 / 154
页数：5
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*M PLANCK I HALBL, D81739 M PLANCK I HA
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