Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz

被引：48

作者：

Chahine, Imad ^{[1
]}

Kadi, Moncef ^{[1
]}

Gaboriaud, Eric ^{[1
]}

Louis, Anne ^{[1
]}

Mazari, Belahcene ^{[1
]}

机构：

[1] Ecole Super Ingenieurs ESIGELEC, Res Inst Embedded Syst IRSEEM, F-76801 Rouen, France

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2008年 / 50卷 / 02期

关键词：

Direct power injection (DPI) method; electromagnetic compatibility (EMC); integrated circuits (ICs); neural network (NN) applications; susceptibility;

D O I：

10.1109/TEMC.2008.918983

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper deals with the characterization, as well as the modeling, of the susceptibility of integrated circuits (ICs) to conducted electromagnetic disturbances such as a continuous-wave disturbance. Based on accurate measurement results, a robust mathematical model to predict the susceptibility of a CMOS inverter is developed. This model is based on a neural network approach and is validated up to 1 GHz for different test criteria. A good agreement between measurements and simulated results is reported. The mathematical model is implemented in a software tool such as Advanced Design System in order to facilitate its operation in the evaluation of the susceptibility of ICs.

引用

页码：285 / 293

页数：9

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