RHEED study of c(4x4)->(2x4) transition on GaAs(001) surface

被引:2
|
作者
Alexeev, AN [1 ]
Karpov, SY [1 ]
Pogorelsky, YV [1 ]
Sokolov, IA [1 ]
机构
[1] CTR ADV TECHNOL,ST PETERSBURG 194156,RUSSIA
关键词
D O I
10.1016/0022-0248(96)00038-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A new (2 x 1) surface structure was observed during the c(4 x 4) --> (2 x 4) transition while increasing the temperature in the range of 430-500 degrees C. Different models based on the electron stability criterion are proposed for this structure. Predictions made using these models are compared with experimental observations. The time-resolved study of c(4 x 4) --> (2 x 4) transition dynamics shows that 0.2 ML of gallium deposited on the surface induce this transition. This value is close to the gallium coverage theta(Ga) = 0.17 ML required for the electron stabilization of the surface completely filled by arsenic dimers.
引用
收藏
页码:72 / 77
页数:6
相关论文
共 50 条
  • [1] Asymmetric c(4x4)→γ(2x4) reconstruction phase transition on the (001)GaAs Surface
    Galitsyn, Yu. G.
    Dmitriev, D. V.
    Mansurov, V. G.
    Moshchenko, S. P.
    Toropov, A. I.
    JETP LETTERS, 2006, 84 (09) : 505 - 508
  • [2] Reconstruction phase transition γ(2x4)<->c(4x4) on (001)GaAs surface
    Dmitriev, Dmitriy V.
    EDM 2006: 7TH ANNUAL INTERNATIONAL WORKSHOP AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, PROCEEDINGS, 2006, : 38 - 38
  • [3] THE GAAS(001)-C(4X4) AND (2X4) RECONSTRUCTIONS - A COMPARATIVE PHOTOEMISSION-STUDY
    VANDERVEEN, JF
    LARSEN, PK
    NEAVE, JH
    JOYCE, BA
    SOLID STATE COMMUNICATIONS, 1984, 49 (07) : 659 - 662
  • [4] Reconstruction phase transition α(2x4)⟨-⟩β(2x4) on (001) GaAs surface
    Dmitriev, DV
    Galitsyn, YG
    Mansurov, VG
    Toropov, AI
    EDM 2005: INTERNATIONAL WORKSHOP AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, PROCEEDINGS, 2005, : 32 - 33
  • [5] THE EFFECT OF RECONSTRUCTION ON RHEED INTENSITIES FOR THE GAAS(001)2X4 SURFACE
    KNIBB, MG
    MAKSYM, PA
    SURFACE SCIENCE, 1988, 195 (03) : 475 - 498
  • [6] ANALYSIS OF RHEED DATA FROM THE GAAS(001)2X4 SURFACE
    MCCOY, JM
    KORTE, U
    MAKSYM, PA
    MEYEREHMSEN, G
    SURFACE SCIENCE, 1992, 261 (1-3) : 29 - 47
  • [7] In situ simulation by RHEED of GaAs (001) β2(2x4) reconstructed surface
    Khachab, H.
    Abdelkafi, Y.
    Belghachi, A.
    2009 INTERNATIONAL CONFERENCE ON INFORMATION AND MULTIMEDIA TECHNOLOGY, PROCEEDINGS, 2009, : 517 - 523
  • [8] Theoretical study of the Si/GaAs(001)-c(4x4) surface
    Bass, JM
    Matthai, CC
    PHYSICAL REVIEW B, 1997, 55 (19): : 13032 - 13039
  • [9] Determination of the atomic geometry of the GaAs(001)2x4 surface by dynamical RHEED intensity analysis:: the β2(2x4) model
    McCoy, JM
    Korte, U
    Maksym, PA
    SURFACE SCIENCE, 1998, 418 (01) : 273 - 280
  • [10] Structural change of As-stabilized GaAs(001)-(2x4) and -c(4x4) induced by zinc exposure
    Miwa, S
    Kuo, LH
    Kimura, K
    Yasuda, T
    Yao, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (3B): : L337 - L340