Time Resolved Measurements of X-ray Induced Partial Discharges

被引:0
|
作者
Adili, Sedat [1 ]
Herrmann, Lorenz G. [2 ]
Franck, Christian M. [1 ]
机构
[1] Swiss Fed Inst Technol, Power Syst & High Voltage Labs, CH-8092 Zurich, Switzerland
[2] ABB Switzerland Ltd, Corp Res, CH-5405 Baden, Switzerland
关键词
PD;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The initial statistical time lag of partial discharge (PD) measurements was eliminated by using short x-ray pulses (duration 50 ns) for triggering. Phase resolved PD (PRPD) patterns at low electric field levels were recorded. No significant difference between the PRPD patterns after x-ray pulse triggering and naturally incepted PDs was observed. These measurements were performed with self-produced spherical void samples and even voids of 0.5 mm were detected after one x-ray pulse application. It is assumed that the x-ray pulses provide necessary start electrons to start an avalanche. However, in order to study the effect of the x-ray pulse on the triggering and on the discharge mechanism, time resolved PD measurements with an ultra-wideband detection circuit are necessary. In this work, the classical wide-band PD detection circuit was modified and time resolved measurements were performed. Particular emphasis is placed on the effect of the x-ray dose on the first PD pulses, here shown for one void size. Moreover, the temporal development of subsequent discharges after the total decay of the x-ray pulse is studied. To increase the accuracy of the detection, optical measurements of the discharge are synchronously made with a photomultiplier tube.
引用
收藏
页码:125 / 128
页数:4
相关论文
共 50 条
  • [41] On the theory of time-resolved X-ray diffraction
    Henriksen, Niels E.
    Moller, Klaus B.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2008, 112 (02): : 558 - 567
  • [42] Time-resolved X-ray absorption spectroscopy
    Bressler, Christian
    Chergui, Majed
    ACTUALITE CHIMIQUE, 2008, (317): : 59 - 61
  • [43] Development of time-resolved X-ray spectrometer
    Miura, E.
    Shinbo, M.
    Owadano, Y.
    Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory, 1997, 61 (03): : 51 - 56
  • [44] Time-resolved fluorescent X-ray interference
    Sasaki, YC
    Suzuki, Y
    Yamanashi, H
    Arai, A
    Yanagihara, M
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1075 - 1078
  • [45] Time-resolved nanocrystallography with X-ray lasers
    Spence, John C. H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C5 - C5
  • [46] Ultrafast time-resolved X-ray diffraction
    Sokolowski-Tinten, K
    Blome, C
    Blums, J
    Cavalleri, A
    Dietrich, C
    Tarasevitch, A
    von der Linde, D
    SCIENCE OF SUPERSTRONG FIELD INTERACTIONS, 2002, 634 : 11 - 18
  • [47] Time resolved x-ray diffraction in solids and liquids
    Tomov, IV
    Chen, P
    Rentzepis, PM
    CURRENT CHALLENGES ON LARGE SUPRAMOLECULAR ASSEMBLIES, 1999, 519 : 287 - 317
  • [48] Time-resolved hard x-ray spectrometer
    Moy, Kenneth
    Cuneo, Michael
    McKenna, Ian
    Keenan, Thomas
    Sanford, Thomas
    Mock, Ray
    HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS AND PENETRATING RADIATION SYSTEMS VIII, 2006, 6319
  • [49] Time resolved X-ray studies in semiconductor nanostructures
    Jurgilaitis, A.
    Harb, M.
    Enquist, H.
    Nuske, R.
    Persson, A.
    Larsson, J.
    2012 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2012,
  • [50] Time-resolved X-ray diffraction at NERL
    Kinoshita, K
    Harano, H
    Yoshii, K
    Ohkubo, T
    Fukasawa, A
    Nakamura, K
    Uesaka, M
    LASER AND PARTICLE BEAMS, 2001, 19 (01) : 125 - 131