Super-Resolution Time Domain Reflectometry Method for Microwave Imaging System Applications

In this paper, a novel method for accurate modeling of microstrip discontinuities based on pulse shaping modulation is presented. The proposed method uses a novel excitation signal to address typical challenges when utilizing conventional TDR using Gaussian pulse excitation. In the first step a Double-Exponential Pulse (DEP) is utilized in a modified TDR system to improve the discontinuity localization precision as it has a sharp rise time. Second, a Linear Frequency Modulated (LFM) signal is used to provide more energy at higher frequencies in contrast with the conventional TDR. Subsequently, a mixed DEP and LFM signals are utilized to combine both advantages: high precision of DEP, and the accuracy of LFM. Simulated results are presented to explore the potential of the proposed method.