Transition from laminar to three-dimensional growth mode in pulsed laser deposited BiFeO3 film on (001) SrTiO3

被引：15

作者：

Chinta, Priya V. ^{[1
,2
]}

Callori, Sara J. ^{[3
]}

Dawber, Matthew ^{[3
]}

Ashrafi, Almamun ^{[1
,2
]}

Headrick, Randall L. ^{[1
,2
]}

机构：

[1] Univ Vermont, Dept Phys, Burlington, VT 05405 USA

[2] Univ Vermont, Mat Sci Program, Burlington, VT 05405 USA

[3] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA

来源：

APPLIED PHYSICS LETTERS | 2012年 / 101卷 / 20期

基金：

美国国家科学基金会;

关键词：

atomic force microscopy; bismuth compounds; electric domains; ferroelectric materials; ferroelectric switching; ferroelectric thin films; ferroelectric transitions; monolayers; multiferroics; nucleation; pulsed laser deposition; X-ray scattering; X-RAY; HETEROSTRUCTURES; SURFACES;

D O I：

10.1063/1.4765363

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Real-time specular x-ray reflectivity of pulsed laser deposited BiFeO3 films exhibits unit-cell oscillations, with diffuse scattering intensity out-of-phase with the specular intensity. The growth mode is thus identified as nucleation and coalescence of unit-cell height islands. The growth rate is insensitive to the deposition rate, suggesting self-limiting growth. Beyond several monolayers the diffuse intensity increases abruptly, signaling a transition from two-dimensional to three-dimensional growth. Ex situ atomic force microscopy shows that mounds merge after a few more deposited layers, leaving arrays of mesas with some holes due to incomplete coalescence. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4765363]

引用

页数：5

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