The opportunities and challenges of bringing new metrology equipment to market

被引：0
|
作者：
Perloff, DS [1 ]
机构：
[1] ReVera Inc, Sunnyvale, CA 94086 USA
来源：
CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005 | 2005年 / 788卷
关键词：
metrology; inspection; process control; equipment; technology; venture capital;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This paper provides an overview of the economic and technological factors which are driving the demand for new metrology and inspection equipment, the challenges and opportunities facing new companies in bringing such equipment to market, and the funding environment in which new companies must raise capital to finance their efforts. Seven metrology companies and one inspection equipment company that have received first-time venture backing since 2000 are used to illustrate how these specialized businesses are launched and funded.
引用
收藏
页码：11 / 20
页数：10
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