Simplified method for measurements and calculations of coupling coefficients and Qο factor of high-temperature superconducting dielectric resonators

被引:43
作者
Jacob, MV [1 ]
Mazierska, J
Leong, K
Krupka, J
机构
[1] James Cook Univ N Queensland, Townsville, Qld 4811, Australia
[2] Warsaw Univ Technol, Inst Microelect & Optoelect, PL-00662 Warsaw, Poland
关键词
dielectric resonator; high-temperature superconductors; surface resistance;
D O I
10.1109/22.971627
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To accurately determine the surface resistance of high-temperature superconducting films, multifrequency measurements of S-21, S-11, and S-22 and sophisticated data processing are required. As a result, surface resistance measurements and calculations for varying temperatures are very time consuming. In this paper, we introduce a simplified method for calculations of the unloaded Q (Q(o)) factor, which require measurements of S-11 and S-22 at the lowest temperature only. For all other temperatures, only S-21 measurements are needed. The method has been shown to give sufficiently accurate Q(o) values and, hence, the surface resistance of superconducting samples, as compared to results obtained from S-21, S-11, and S-22 measurements using the transmission-mode Q factor technique. The presented method has been tested under different coupling coefficients and frequencies.
引用
收藏
页码:2401 / 2407
页数:7
相关论文
共 12 条
  • [1] RADIO-FREQUENCY SURFACE-RESISTANCE OF LARGE-AREA BI-SR-CA-CU-O THICK-FILMS ON AG PLATES
    BOHN, CL
    DELAYEN, JR
    BALACHANDRAN, U
    LANAGAN, MT
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (03) : 304 - 306
  • [2] Ginzton E., 1957, MICROWAVE MEASUREMEN
  • [3] MICROWAVE MEASUREMENT OF TEMPERATURE AND CURRENT DEPENDENCES OF SURFACE IMPEDANCE FOR HIGH-TC SUPERCONDUCTORS
    KOBAYASHI, Y
    IMAI, T
    KAYANO, H
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (09) : 1530 - 1538
  • [4] Surface Resistance Measurements of HTS Films by Means of Sapphire Dielectric Resonators
    Krupka, Jerzy
    Klinger, Martin
    Kuhn, Matthias
    Baranyak, Andreas
    Stiller, Michael
    Hinken, Johann
    Modelski, Jozef
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1993, 3 (03) : 3043 - 3048
  • [5] LEONG K, IN PRESS IEEE T MICR
  • [6] Leong K, 2000, THESIS J COOK U TOWN
  • [7] CONFOCAL RESONATORS FOR MEASURING THE SURFACE-RESISTANCE OF HIGH-TEMPERATURE SUPERCONDUCTING FILMS
    MARTENS, JS
    HIETALA, VM
    GINLEY, DS
    ZIPPERIAN, TE
    HOHENWARTER, GKG
    [J]. APPLIED PHYSICS LETTERS, 1991, 58 (22) : 2543 - 2545
  • [8] Concerning the Use of High-Temperature Superconductivity in Planar Microwave Filters
    Matthaei, George L.
    Hey-Shipton, Gregory L.
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (07) : 1287 - 1294
  • [9] Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications
    Mazierska, J
    [J]. JOURNAL OF SUPERCONDUCTIVITY, 1997, 10 (02): : 73 - 84
  • [10] Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonators
    Mazierska, J
    Wilker, C
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) : 3217 - 3225