Electronic structure of Ni and Mo silicides investigated by x-ray emission spectroscopy and density functional theory

被引:15
|
作者
Jarrige, Ignace
Capron, Nathalie
Jonnard, Philippe
机构
[1] CNRS, Lab Chim Phys Mat & Rayonnement, F-75231 Paris 05, France
[2] Univ Paris 06, LCPMR, F-75005 Paris, France
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 03期
关键词
bonds (chemical); crystal structure; density functional theory; electronic density of states; molybdenum compounds; nickel compounds; X-ray emission spectra; TRANSITION-METAL SILICIDES; PLANE-WAVE BASIS; BAND-STRUCTURE; DI-ALUMINIDES; THIN-FILMS; OF-STATES; NICKEL; NISI2; DISILICIDES; PHOTOEMISSION;
D O I
10.1103/PhysRevB.79.035117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report a combined study of the electronic structure of NiSi(2), Ni(2)Si, MoSi(2), and Mo(5)Si(3) using x-ray emission spectroscopy and density functional theory. The local and partial metal d and Si p and sd densities of states (DOSs) are obtained for the four compounds both experimentally and theoretically. This allows refined insight into the Si-metal bonding interaction, shown to be determined by a competition between the effects of the lattice structure and of the spatial extent of the metal d wave function. The latter effect is found to prevail for all four compounds, based on the prominent Si-Mo pd hybridization found in the DOS of MoSi(2) and Mo(5)Si(3) and the dominant Ni-Ni dd interaction observed in the electronic structure of NiSi(2) and Ni(2)Si.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Electronic structure of advanced materials studied by X-ray emission spectroscopy
    Kurmaev, E.Z.
    Galakhov, V.R.
    Yarmoshenko, Yu.M.
    Trofimova, V.A.
    Shamin, S.N.
    Cherkashenko, V.M.
    Poteryaev, A.I.
    Anisimov, V.I.
    Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 1998, 13 (4-5): : 637 - 649
  • [32] Electronic structure of advanced materials studied by x-ray emission spectroscopy
    Kurmaev, EZ
    Galakhov, VR
    Yarmoshenko, YM
    Trofimova, VA
    Shamin, SN
    Cherkashenko, VM
    Poteryaev, AI
    Anisimov, VI
    X-RAY AND INNER-SHELL PROCESSES - 17TH INTERNATIONAL CONFERENCE, 1997, (389): : 771 - 785
  • [33] Electronic Structure of Sulfur Studied by X-ray Absorption and Emission Spectroscopy
    Mori, R. Alonso
    Paris, E.
    Giuli, G.
    Eeckhout, S. G.
    Kavcic, M.
    Zitnik, M.
    Bucar, K.
    Pettersson, L. G. M.
    Glatzel, P.
    ANALYTICAL CHEMISTRY, 2009, 81 (15) : 6516 - 6525
  • [34] Probing enantioselectivity with x-ray photoelectron spectroscopy and density functional theory
    Schillinger, R.
    Sljivancanin, Z.
    Hammer, B.
    Greber, T.
    PHYSICAL REVIEW LETTERS, 2007, 98 (13)
  • [35] Density Functional Theory Based Methods for the Calculation of X-ray Spectroscopy
    Besley, Nicholas A.
    ACCOUNTS OF CHEMICAL RESEARCH, 2020, 53 (07) : 1306 - 1315
  • [36] Electronic structure of nanostructured ZnO from x-ray absorption and emission spectroscopy and the local density approximation
    Dong, CL
    Persson, C
    Vayssieres, L
    Augustsson, A
    Schmitt, T
    Mattesini, M
    Ahuja, R
    Chang, CL
    Guo, JH
    PHYSICAL REVIEW B, 2004, 70 (19) : 1 - 5
  • [37] Chemical and electronic structures of liquid methanol from x-ray emission spectroscopy and density functional theory -: art. no. 104205
    Kashtanov, S
    Augustson, A
    Rubensson, JE
    Nordgren, J
    Ågren, H
    Guo, JH
    Luo, Y
    PHYSICAL REVIEW B, 2005, 71 (10)
  • [38] Bulk electronic structure of Mn2NiGa using hard x-ray photoelectron spectroscopy and density functional theory
    Sadhukhan, Pampa
    Sarkar, Shuvam
    D'Souza, Sunil Wilfred
    Gloskovskii, Andrei
    Roy Barman, Sudipta
    PHYSICA SCRIPTA, 2023, 98 (05)
  • [39] Band gap and electronic structure of MgSiN2 determined using soft X-ray spectroscopy and density functional theory
    de Boer, Tristan
    Boyko, Teak D.
    Braun, Cordula
    Schnick, Wolfgang
    Moewes, Alexander
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2015, 9 (04): : 250 - 254
  • [40] Valence band density of states of transition metal silicides studied by soft X-ray emission spectroscopy
    Wang, Jinliang
    Wang, Tianmin
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 21 (08): : 754 - 759