共 50 条
- [21] Infrared spectroscopy of sub-surface defects induced by remote hydrogen plasma exposure of silicon(100) HYDROGEN IN SEMICONDUCTORS AND METALS, 1998, 513 : 375 - 380
- [22] Fault Isolation of Sub-surface Leakage Defects Using Electron Beam Induced Current Characterization in Next-Generation Flash Memory Technology Development ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2010, : 62 - 65
- [24] Imaging sub-surface defects in power electronic modules using shear-force microscopy 2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020), 2020, : 1396 - 1401
- [25] Microscopic stress analysis of nanoscratch induced sub-surface defects in a single-crystal silicon wafer PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2023, 82 : 290 - 303
- [27] Sub-surface crack detection by using laser induced transient stress wave propagation ADVANCES IN FRACTURE AND STRENGTH, PTS 1- 4, 2005, 297-300 : 1992 - 1997
- [29] Automated damage detection of bridges sub-surface defects from infrared images using machine learning HEALTH MONITORING OF STRUCTURAL AND BIOLOGICAL SYSTEMS XV, 2021, 11593
- [30] Progress in Detection and Suppression Techniques for Processing-induced Sub-surface Defects of Fused Silica Optical Elements Jixie Gongcheng Xuebao/Journal of Mechanical Engineering, 2021, 57 (20): : 1 - 19