Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

被引:337
作者
Leite, Fabio L. [1 ]
Bueno, Carolina C. [1 ]
Da Roz, Alessandra L. [1 ]
Ziemath, Ervino C. [2 ]
Oliveira, Osvaldo N., Jr. [3 ]
机构
[1] Fed Univ Sao Carlos UFSCar, Dept Phys Chem & Math, Nanoneurobiophys Res Grp, BR-18052780 Sao Paulo, Brazil
[2] Sao Paulo State Univ UNESP, Inst Geosci & Exact Sci, BR-13550970 Sao Paulo, Brazil
[3] Univ Sao Paulo, Inst Phys Sao Carlos, BR-13560970 Sao Paulo, Brazil
基金
巴西圣保罗研究基金会;
关键词
van der Waals; adhesion; surface forces; atomic force microscopy; atomic force spectroscopy; structural forces; double-layer; wettability; AFM; VAN-DER-WAALS; CONTACT-ANGLE INTERPRETATION; JKR-DMT TRANSITION; POLY(O-ETHOXYANILINE) NANOSTRUCTURED FILMS; MOLECULAR-DYNAMICS SIMULATIONS; NANOSCALE ROUGH SURFACES; LONG-RANGE ATTRACTION; EXTENDED DLVO THEORY; LENNARD-JONES FLUID; PULL-OFF FORCES;
D O I
10.3390/ijms131012773
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS), it is now possible to measure these forces accurately, in addition to providing information on local material properties such as elasticity, hardness and adhesion. This review provides the theoretical and experimental background of AFS, adhesion forces, intermolecular interactions and surface forces in air, vacuum and in solution.
引用
收藏
页码:12773 / 12856
页数:84
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