Structure and oxide anion conductivity in Ln2(TO4)O (Ln = La, Nd; T = Ge, Si)

被引：17

作者：

Leon-Reina, Laura ^{[1
]}

Porras-Vazquez, Jose M. ^{[2
]}

Losilla, Enrique R. ^{[2
]}

Moreno-Real, Laureano ^{[2
]}

Aranda, Miguel A. G. ^{[2
]}

机构：

[1] Univ Malaga, Lab Difracc Rayos X, Serv Cent Apoyo Invest, E-29071 Malaga, Spain

[2] Univ Malaga, Dept Quim Inorgan Cristalog & Mineral, E-29071 Malaga, Spain

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 2008年 / 181卷 / 09期

关键词：

oxide anion conductivity; p-type electronic conductivity; neutron diffraction; oxy-apatite;

D O I：

10.1016/j.jssc.2008.06.029

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

Oxy-silicate and oxy-germanate, Ln(2)(TO4)O (Ln = La and Nd, T = Ge and Si) compounds have been prepared. Oxy-germanates can be readily obtained as highly crystalline single phases, while, the oxy-silicates are difficult to prepare as pure phases. The crystal structure of Nd-2(SiO4)O has been studied from a joint Rietveld refinement of neutron and laboratory X-ray powder diffraction data. The electrochemical characterisation indicates that these compounds display oxide anion conductivity with p-type electronic contribution under oxidising conditions. The apparent activation energies under dry flowing nitrogen, where p-type contribution is minimised, are 0.97(1), 1.05(3) and 1.17(4)eV, for Nd-2(SiO4)O, La-2(GeO4)O and Nd-2(GeO4)O, respectively. The overall conductivities at 1173 K range from 1.2 x 10(-4) S cm(-1) for Nd-2(SiO4)O to 1.3 x 10(-6) S cm(-1) for La-2(GeO4)O. Finally, the stability of these compounds under very reducing conditions has been studied and partial degradation is reported. (C) 2008 Elsevier Inc. All rights reserved.

引用

页码：2501 / 2506

页数：6

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