Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

被引：57
作者：
Chalupsky, J. [1 ,2 ]
Juha, L. [1 ]
Hajkova, V. [1 ]
Cihelka, J. [1 ]
Vysin, L. [1 ,2 ]
Gautier, J. [3 ]
Hajdu, J. [6 ]
Hau-Riege, S. P. [7 ]
Jurek, M. [5 ]
Krzywinski, J. [5 ]
London, R. A. [7 ]
Papalazarou, E. [3 ]
Pelka, J. B. [5 ]
Rey, G. [3 ]
Sebban, S. [3 ]
Sobierajski, R. [5 ]
Stojanovic, N. [4 ]
Tiedtke, K. [4 ]
Toleikis, S. [4 ]
Tschentscher, T. [4 ]
Valentin, C. [3 ]
Wabnitz, H. [4 ]
Zeitoun, P. [3 ]
机构：
[1] Acad Sci Czech Republ, Inst Phys, Na Slovance 2, Prague 18221 8, Czech Republic
[2] Czech Tech Univ, Prague 16636 1, Czech Republic
[3] Ecole Polytech, CNRS, ENSTA, Lab Opt Appl, F-91761 Palaiseau, France
[4] DESY, Deut Elektronen Synchrotron, D-22603 Hamburg, Germany
[5] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[6] Uppsala Univ, Biomed Ctr, SE-75124 Uppsala, Sweden
[7] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
来源：
OPTICS EXPRESS | 2009年 / 17卷 / 01期
关键词：
LASER-DESORPTION; ABLATION; RADIATION; VACUUM;
D O I：
10.1364/OE.17.000208
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly ( methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg ( FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible. (C) 2008 Optical Society of America
引用
收藏
页码：208 / 217
页数：10
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