Laser processing of GaN-based LEDs with ultraviolet picosecond laser pulses

被引:3
作者
Moser, Ruediger [1 ]
Kunzer, Michael [1 ]
Gossler, Christian [1 ]
Schmidt, Ralf [1 ]
Koehler, Klaus [1 ]
Pletschen, Wilfried [1 ]
Schwarz, Ulrich T. [1 ]
Wagner, Joachim [1 ]
机构
[1] Fraunhofer Inst Angew Festkorperphys IAF, D-79108 Freiburg, Germany
来源
LASER SOURCES AND APPLICATIONS | 2012年 / 8433卷
关键词
light-emitting diode; ultraviolet; picosecond laser; direct writing; ablation threshold; prototyping; trench; mesa; TRANSPARENT MATERIALS; FEMTOSECOND; DAMAGE; IRRADIATION; SAPPHIRE;
D O I
10.1117/12.921843
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Picosecond (ps) lasers provide a universal tool for material processing. Due to the short pulse length material is removed by a process called "cold ablation", with minimal thermal damage to neighbouring regions. As a result, better defined structures with smother and cleaner side walls can be fabricated than with nanosecond (ns) laser pulses. This offers new possibilities for laser processing in semiconductor technology for both semiconductor materials as well as contact and bond metallizations. The fabrication of optoelectronic devices such as light-emitting diodes (LEDs) typically involves photolithography steps, requiring specific lithography masks be fabricated which, in particular for prototyping, is expensive and time consuming. Therefore it would be attractive for a range of applications to replace these steps by direct writing techniques such as laser processing, which will speed up e. g. the development and prototyping of new devices. We report on fully laser processed planar GaN-based LEDs fabricated without any photolithography steps. On the bare semiconductor wafer, isolation trenches and mesa structures are formed directly by ultraviolet ps laser pulses. For the direct deposition of patterned ohmic contact metallizations, the ps laser fabrication and subsequent use of high resolution shadow masks is presented, which exhibit a significantly reduced sidewall roughness compared to masks produced by ns laser pulses. Due to the higher precision of the laser defined masks it becomes possible to deposit multiple layers, through the use of alignment marks, similar to multiple mask level photolithography. Finally, the ps laser processed LEDs are electrically and optically characterized and their characteristic compared with that of conventionally fabricated mesa LEDs.
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页数:12
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