Improvement in the spectral response at long wavelength of a-SiGe:H solar cells by exponential band gap design of the i-layer

被引:0
|
作者
Zambrano, RJ
Rubinelli, FA
Rath, JK
Schropp, REI
机构
[1] Univ Utrecht, Debye Res Inst, NL-3508 TA Utrecht, Netherlands
[2] Univ Nacl Litoral Guemes, INTEC, RA-3000 Santa Fe, Argentina
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暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A new band gap profile (exponential profile) for the active layer of the a-SiGc:H single junction cell has been designed and experimentally demonstrated. In this paper we compare its optical and electrical characteristics with the two more common profiles: the U- and V-shapes. As predicted by the simulations, the new profile combines the advantages of both profiles. Like the V-shape, the exponential shape reduces the amount of Ge in the i-layer, decreasing both the space charge defect density inside the i-layer and the recombination losses. It also improves the electric field. At the same time. the exponential shape generates the same current density as the U-shape. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:1131 / 1135
页数:5
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