RRAM-Based TCAMs for Pattern Search

被引:0
作者
Zheng, Le [1 ]
Shin, Sangho [2 ]
Lloyd, Scott [3 ]
Gokhale, Maya [3 ]
Kim, Kyungmin [4 ]
Kang, Sung-Mo [4 ,5 ]
机构
[1] Hewlett Packard Labs, Palo Alto, CA 94304 USA
[2] Rowan Coll, Dept ECE, Glassboro, NJ 08028 USA
[3] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[4] Univ Calif Santa Cruz, Dept EE, Santa Cruz, CA 95064 USA
[5] Korea Adv Inst Sci & Technol, Taejon 305701, South Korea
来源
2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2016年
关键词
memristor; TCAM; pattern search; emulator;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Content Addressable Memory (CAM) is beneficial to applications that require high-speed pattern searching as it provides fast associative lookup operations. As the amount of data to search continues to grow, reducing power consumption while minimizing the costs for speed and area is the main thread of research in designing large capacity CAMs. In this work, we are presenting an active memory architecture incorporating a searchable resistive memory. The proposed architecture incorporates processing logic in close proximity to the RRAM and the RRAM-based TCAM, where the unit TCAM cell is comprised of five transistors and two memristors. Analyzed and simulated performance (e.g., latency, energy consumption, and storage density) of the RRAM-based TCAM at various technology nodes are presented and compared to those of prior CAM/TCAM designs.
引用
收藏
页码:1382 / 1385
页数:4
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