A single-beam 3DoF homodyne interferometer

被引:9
作者
Yu, Liang [1 ,2 ,3 ]
Molnar, Gabor [4 ]
Werner, Christian [2 ]
Weichert, Christoph [2 ]
Koening, Rainer [2 ]
Danzebrink, Hans-Ulrich [2 ]
Tan, Jiubin [1 ,3 ]
Fluegge, Jens [2 ]
机构
[1] Harbin Inst Technol, Ctr Ultraprecis Optoelect Instrument Engn, Harbin 150080, Peoples R China
[2] Phys Tech Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
[3] Harbin Inst Technol, Minist Ind & Informat Technol, Key Lab Ultraprecis Intelligent Instrumentat, Harbin 150080, Peoples R China
[4] MPro GmbH, Zum Bahnhof 9, D-98593 Floh Seligenthal, Germany
关键词
nanometrology; homodyne interferometry; 3; degrees-of-freedom; differential wavefront sensing; CMOS camera; NONLINEARITY;
D O I
10.1088/1361-6501/ab7f79
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, a camera-based 3DoF homodyne interferometer is proposed to measure displacements and rotations with precision below nanometre/microradian level. The interferometer uses a single beam, has a simple and compact layout and is easy to adjust. A spatial interference pattern is introduced by a tilted reference mirror and recorded by a camera chip. The variation of the spacing and orientation of the fringes is correlated with the yaw and pitch angular rotation of the moving mirror, while the phase correlates with its displacement. The noise level and resolution of displacement and angle measurements were determined to be below 5 pm/root Hz and 5 nrad/root Hz above 1 Hz. Periodic nonlinearities of the system were mainly caused by multi-reflections between optical surfaces in the system. By choosing particular components and improving their adjustment, the displacement nonlinearity was reduced to be below 0.1 nm, and angle nonlinearities achieved sub-microradian level.
引用
收藏
页数:10
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共 17 条
  • [1] A frequency domain method for the measurement of nonlinearity in heterodyne interferometry
    Badami, VG
    Patterson, SR
    [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 2000, 24 (01): : 41 - 49
  • [2] RECENT ADVANCES IN DISPLACEMENT MEASURING INTERFEROMETRY
    BOBROFF, N
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 1993, 4 (09) : 907 - 926
  • [3] EFFECT OF DIFFRACTION ON INTERFERENTIAL LENGTH MEASUREMENTS
    DORENWENDT, K
    BONSCH, G
    [J]. METROLOGIA, 1976, 12 (02) : 57 - 60
  • [4] Compact fiber-coupled three degree-of-freedom displacement interferometry for nanopositioning stage calibration
    Gillmer, S. R.
    Smith, R. C. G.
    Woody, S. C.
    Ellis, J. D.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2014, 25 (07)
  • [5] Jäger G, 2006, MATER SCI FORUM, V505-507, P7, DOI 10.4028/www.scientific.net/MSF.505-507.7
  • [6] The statistical uncertainty of the Heydemann correction: a practical limit of optical quadrature homodyne interferometry
    Koening, Rainer
    Wimmer, Gejza
    Witkovsky, Viktor
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2015, 26 (08)
  • [7] Retrace error: Interferometry's dark little secret
    Kreischer, Cody B.
    [J]. OPTIFAB 2013, 2013, 8884
  • [8] Laser homodyne straightness interferometer with simultaneous measurement of six degrees of freedom motion errors for precision linear stage metrology
    Lou, Yingtian
    Yan, Liping
    Chen, Benyong
    Zhang, Shihua
    [J]. OPTICS EXPRESS, 2017, 25 (06): : 6805 - 6821
  • [9] Simultaneous multiple degrees of freedom (DoF) measurement system
    Molnar, G.
    Strube, S.
    Koechert, P.
    Danzebrink, H-U
    Fluegge, J.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2016, 27 (08)
  • [10] SIGNAL STRENGTH IN 2-BEAM INTERFEROMETERS WITH LASER ILLUMINATION
    ROWLEY, WRC
    [J]. OPTICA ACTA, 1969, 16 (02): : 159 - +