Influence of the third-order parameter on diffuse reflectance at small source-detector separations

被引:20
|
作者
Tian, HJ [1 ]
Liu, Y [1 ]
Wang, LJ [1 ]
机构
[1] Tianjin Univ, Coll Sci, Key Lab Optoelect Informat Tech Sci, Minist Educ, Tianjin 300072, Peoples R China
关键词
D O I
10.1364/OL.31.000933
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Spatially resolved reflectance close to source has received a great deal of attention recently. This research is considered to develop a new noninvasive technique for measuring the optical properties of biological media. Using Monte Carlo simulations, we investigated the influence of third-order parameter delta on diffuse reflectance and found that the reflectance decreased with an increase of delta at a short source-detector separation of approximately 0.7-2 transport mean free paths. We show that the effects of two parameters, gamma and second-order parameter delta, on the reflectance are contrary. As a result the influence of the second-order parameter gamma on the reflectance is irregular when the condition Delta delta <<Delta gamma is not satisfied. (c) 2006 Optical Society of America.
引用
收藏
页码:933 / 935
页数:3
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