共 50 条
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- [2] Roadblocks and critical aspects of cleaning for sub-65nm technologies 2006 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA), PROCEEDINGS OF TECHNICAL PAPERS, 2006, : 123 - +
- [3] Leakage reduction for domino circuits in sub-65nm technologies IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2006, : 164 - +
- [4] Roadblocks and critical aspect of cleaning for sub-65nm technologies 2005 IEEE VLSI-TSA International Symposium on VLSI Technology (VLSI-TSA-TECH), Proceedings of Technical Papers, 2005, : 95 - 96
- [5] Performance Analysis of 3D-IC for Multi-Core Processors in sub-65nm CMOS technologies 2010 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, 2010, : 2876 - 2879
- [7] Integration of high-K dielectrics into sub-65nm CMOS technology: Requirements and challenges TENCON 2004 - 2004 IEEE REGION 10 CONFERENCE, VOLS A-D, PROCEEDINGS: ANALOG AND DIGITAL TECHNIQUES IN ELECTRICAL ENGINEERING, 2004, : D320 - D323
- [8] On-chip Digital Idn and Idp Measurement by 65 nm CMOS Speed Monitor Circuit 2008 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE, 2008, : 401 - +
- [9] Logic soft errors in sub-65nm technologies design and CAD challenges 42ND DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2005, 2005, : 2 - 4
- [10] An All-Digital On-Chip Jitter Measurement Circuit in 65nm CMOS technology 2011 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), 2011, : 179 - 182