Ion beam analysis with external beams: Recent set-up improvements

被引：32

作者：

Calligaro, T ^{[1
]}

Dran, JC ^{[1
]}

Moignard, B ^{[1
]}

Pichon, L ^{[1
]}

Salomon, J ^{[1
]}

Walter, P ^{[1
]}

机构：

[1] Ctr Rech & Restaurat Musees France, CNRS UMR 171, F-75041 Paris 01, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2002年 / 188卷

关键词：

external beam; PIXE; RBS;

D O I：

10.1016/S0168-583X(01)01062-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Accelerator-based analytical techniques using external beams are ideally fitted to the study of works of art because of their fully non-destructive character However. accurate quantitative analysis is not straightforward. due in particular to difficult beam monitoring, Significant improvements have been progressively made on the external beam line of the IBA facility of the Louvre museum in order to increase the accuracy and to conduct combined analyses with different IBA techniques. (C) 2002 Published by Elsevier Science B.V.

引用

页码：135 / 140

页数：6

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