Determining the nonlinear refractive index of fused quartz by Femtosecond Laser Z-scan technology

被引:0
作者
Zhang, Lin [1 ]
Ren, Huan [1 ]
Ma, Hua [1 ]
Shi, Zhendong [1 ]
Yang, Yi [1 ]
Yuan, Quan [1 ]
Feng, Xiaoxuan [1 ]
Ma, Yurong [1 ]
Chen, Bo [1 ]
机构
[1] CAEP, Res Ctr Laser Fus, POB 919-984, Mianyang 621900, Peoples R China
来源
OPTICAL MEASUREMENT TECHNOLOGY AND INSTRUMENTATION | 2016年 / 10155卷
关键词
Fused quartz; Femtosecond laser; Z-scan technology; accumulation of thermal effects; N2; MEASUREMENTS; SINGLE-BEAM; GLASSES; CS2;
D O I
10.1117/12.2246627
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Z-scan technology is an experimental technique for determining the nonlinear refractive index based on the principle of transformation of phase distortion to amplitude distortion when a laser beam propagates through a nonlinear material. For most of the Z-scan system based on the nanosecond or picosecond laser, the accumulation of thermal effects becomes a big problem in nonlinear refractive index measurement especially for the nonlinear materials such as fused quartz and neodymium glass which have a weak nonlinear refractive effect. To overcome this problem, a system for determining the nonlinear refractive index of optical materials based on the femtosecond laser Z-scan technology is presented. Using this system, the nonlinear refractive index of the fused quartz is investigated.
引用
收藏
页数:6
相关论文
共 13 条
[1]   NONLINEAR REFRACTIVE-INDEX MEASUREMENTS OF GLASSES USING 3-WAVE FREQUENCY MIXING [J].
ADAIR, R ;
CHASE, LL ;
PAYNE, SA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1987, 4 (06) :875-881
[2]   PHOTO-ACOUSTIC STUDY OF 2-PHOTON ABSORPTION IN HEXAGONAL ZNS [J].
BAE, Y ;
SONG, JJ ;
KIM, YB .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (01) :615-619
[3]  
Born M., 1959, Principles of Optics
[4]   NONLINEAR OPTICAL-GLASSES FOR ULTRAFAST OPTICAL SWITCHES [J].
FRIBERG, SR ;
SMITH, PW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1987, 23 (12) :2089-2094
[5]   Subsurface defects of fused silica optics and laser induced damage at 351 nm [J].
Liu Hongjie ;
Huang Jin ;
Wang Fengrui ;
Zhou Xinda ;
Ye Xin ;
Zhou Xiaoyan ;
Sun Laixi ;
Jiang Xiaodong ;
Sui Zhan ;
Zheng Wanguo .
OPTICS EXPRESS, 2013, 21 (10) :12204-12217
[6]   STUDY OF OPTICAL EFFECTS DUE TO AN INDUCED POLARIZATION THIRD ORDER IN ELECTRIC FIELD STRENGTH [J].
MAKER, PD ;
TERHUNE, RW .
PHYSICAL REVIEW, 1965, 137 (3A) :A801-+
[7]   INTERFEROMETRIC MEASUREMENTS OF NONLINEAR REFRACTIVE-INDEX COEFFICIENT RELATIVE TO CS2 IN LASER-SYSTEM-RELATED MATERIALS [J].
MORAN, MJ ;
SHE, CY ;
CARMAN, RL .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1975, QE11 (06) :259-263
[8]   ELLIPSE ROTATION STUDIES IN LASER HOST MATERIALS [J].
OWYOUNG, A .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1973, QE 9 (11) :1064-1069
[9]   DETERMINATION OF BOUND-ELECTRONIC AND FREE-CARRIER NONLINEARITIES IN ZNSE, GAAS, CDTE, AND ZNTE [J].
SAID, AA ;
SHEIKBAHAE, M ;
HAGAN, DJ ;
WEI, TH ;
WANG, J ;
YOUNG, J ;
VANSTRYLAND, EW .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1992, 9 (03) :405-414
[10]   HIGH-SENSITIVITY, SINGLE-BEAM N2 MEASUREMENTS [J].
SHEIKBAHAE, M ;
SAID, AA ;
VANSTRYLAND, EW .
OPTICS LETTERS, 1989, 14 (17) :955-957