Thermally stimulated luminescence excitation spectroscopy (TSLES): a versatile technique to study electron transfer processes in solids

被引:14
作者
Fleniken, J [1 ]
Wang, J [1 ]
Grimm, J [1 ]
Weber, MJ [1 ]
Happek, U [1 ]
机构
[1] Univ Georgia, Dept Phys & Astron, Athens, GA 30602 USA
基金
美国国家科学基金会;
关键词
thermally stimulated luminescence; photoionization; excitation spectroscopy;
D O I
10.1016/S0022-2313(01)00339-8
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a technique to locate the ground state of impurity ions relative to the host conduction band. utilizing thermally stimulated luminescence (TSL). The technique makes use of the concept that TSL probes the occupation of electron traps, and the fact that these traps are filled via promotion of impurity electrons into the conduction band. Using tunable radiation we determine the threshold for trap filling, which is given by the ionization threshold of the impurity. This technique is a form of excitation spectroscopy, sensitive to electron (or hole) transport processes in solids. Advantages of TSL excitation spectroscopy over complementary techniques. such as photoconductivity, include impurity specific signals, applicability to both bulk and powder samples, and high sensitivity. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:465 / 469
页数:5
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