A Versatile Flicker Noise Measurement System and Its Applications in CMOS Process

被引：0

作者：

Ma, Zhijian ^{[1
]}

Liu, Zhihong ^{[1
]}

机构：

[1] 2025 Gateway Pl,Suite 130, San Jose, CA 95014 USA

来源：

2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC) | 2016年

关键词：

Flicker noise; 1/f noise; noise measurement; low-noise voltage and current amplifier; noise modeling and noise simulation;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A versatile multi-amplifier flicker noise measurement system with various programmable configurations was developed for accurate and fast on-wafer flicker noise measurement. The noise system performance, which includes system resolution, corner frequency and bandwidth, are thoroughly analyzed by correlating various system configurations, such as selection of LNAs, LNA noise floor, DUT output impedance, and parasitic stray capacitance of on-wafer prober. The system versatility and efficiency are also discussed. A few typical noise measurements are presented in the applications.

引用

页码：220 / 225

页数：6

共 7 条

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[2]

[Anonymous], 2013, 9812D NOIS MEAS SYST

[3]

[Anonymous], 1996, 9603 NOIS MEAS SYST

[4] 1/F NOISE AND THE FIELD-EFFECT IN GATED RESISTORS [J].