Ferroelectricity in Gd-Doped HfO2 Thin Films

被引:243
作者
Mueller, S. [1 ]
Adelmann, C. [2 ]
Singh, A. [1 ]
Van Elshocht, S. [2 ]
Schroeder, U. [1 ]
Mikolajick, T. [1 ,3 ]
机构
[1] Namlab gGmbH, D-01187 Dresden, Germany
[2] IMEC, B-3001 Louvain, Belgium
[3] Tech Univ Dresden, Chair Nanoelect Mat, D-01062 Dresden, Germany
关键词
POLARIZATION;
D O I
10.1149/2.002301jss
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The incorporation of Gd into HfO2 thin films is shown to induce ferroelectricity. A significant influence of electric field cycling on both polarization as well as small-signal capacitance-voltage measurements can be observed. X-ray diffraction measurements are supported by infrared absorption analysis and give further evidence of the previously proposed non-centrosymmetric transition phase of space group Pbc2(1). (C) 2012 The Electrochemical Society. All rights reserved.
引用
收藏
页码:N123 / N126
页数:4
相关论文
共 21 条
  • [11] Study of interfacial reactions and phase stabilization of mixed Sc, Dy, Hf high-k oxides by attenuated total reflectance infrared spectroscopy
    Hardy, A.
    Adelmann, C.
    Van Elshocht, S.
    Van den Rul, H.
    Van Bael, M. K.
    De Gendt, S.
    D'Olieslaeger, M.
    Heyns, M.
    Kittl, J. A.
    Mullens, J.
    [J]. APPLIED SURFACE SCIENCE, 2009, 255 (17) : 7812 - 7817
  • [12] Removal of 90° domain pinning in (100) Pb(Zr0.15Ti0.85)O3 thin films by pulsed operation
    Kohli, M
    Muralt, P
    Setter, N
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (24) : 3217 - 3219
  • [13] Kohli M, 1999, FERROELECTRICS, V225, P961
  • [14] DIELECTRIC AND X-RAY STUDIES OF CACHIBA1-CHITIO3 AND CACHISR1-CHITIO3
    MITSUI, T
    WESTPHAL, WB
    [J]. PHYSICAL REVIEW, 1961, 124 (05): : 1354 - &
  • [15] Ferroelectricity in yttrium-doped hafnium oxide
    Mueller, J.
    Schroeder, U.
    Boescke, T. S.
    Mueller, I.
    Boettger, U.
    Wilde, L.
    Sundqvist, J.
    Lemberger, M.
    Kuecher, P.
    Mikolajick, T.
    Frey, L.
    [J]. JOURNAL OF APPLIED PHYSICS, 2011, 110 (11)
  • [16] Nanosecond Polarization Switching and Long Retention in a Novel MFIS-FET Based on Ferroelectric HfO2
    Mueller, Johannes
    Boescke, Tim S.
    Schroeder, Uwe
    Hoffmann, Raik
    Mikolajick, Thomas
    Frey, Lothar
    [J]. IEEE ELECTRON DEVICE LETTERS, 2012, 33 (02) : 185 - 187
  • [17] Incipient Ferroelectricity in Al-Doped HfO2 Thin Films
    Mueller, Stefan
    Mueller, Johannes
    Singh, Aarti
    Riedel, Stefan
    Sundqvist, Jonas
    Schroeder, Uwe
    Mikolajick, Thomas
    [J]. ADVANCED FUNCTIONAL MATERIALS, 2012, 22 (11) : 2412 - 2417
  • [18] Muller J., 2012, 2012 IEEE Symposium on VLSI Technology, P25, DOI 10.1109/VLSIT.2012.6242443
  • [19] Applications of modern ferroelectrics
    Scott, J. F.
    [J]. SCIENCE, 2007, 315 (5814) : 954 - 959
  • [20] Ferroelectrics go bananas
    Scott, J. F.
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2008, 20 (02)