Analysis of Twin Boundary in Single Crystal of Ni-Mn-Ga Martensite Using Powder Laboratory Diffractometer

被引：0

作者：

Drahokoupil, Jan ^{[1
]}

Straka, Ladislav ^{[2
]}

Heczko, Oleg ^{[1
]}

机构：

[1] ASCR, Inst Phys, Na Slovance 2, Prague 18202, Czech Republic

[2] Aalto Univ, Sch Engn, Lab Engn Mat, FIN-00076 Aalto, Finland

来源：

APPLIED CRYSTALLOGRAPHY XXII | 2013年 / 203-204卷

基金：

芬兰科学院;

关键词：

X-ray; twin boundary; ferromagnetic shape memory alloys; modulated martensite; STRAIN;

D O I：

10.4028/www.scientific.net/SSP.203-204.13

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The presented paper describes X-ray diffraction study of Ni-Mn-Ga modulated martensite single crystal. A standard powder laboratory diffractometer equipped with texture cradle and monocapillary was found to be suitable and sufficient tool for this type of studies. Three different scans were performed to unambiguously identify the martensitic twin variants at selected place. From this identification and with the help of theoretical calculation full description of martensitic microstructure can be determined. In addition the effect of sample displacement on beam position on sample was derived.

引用

页码：13 / +

页数：2

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