A new method for measuring ultra-low water-vapor permeation for OLED displays

被引：2

作者：

Dunkel, R ^{[1
]}

Bujas, R ^{[1
]}

Klein, A ^{[1
]}

Horndt, V ^{[1
]}

机构：

[1] Gen Atom Co, San Diego, CA 92121 USA

来源：

JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 2005年 / 13卷 / 07期

关键词：

OLED; barrier coating; water-vapor permeation;

D O I：

10.1889/1.2001214

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

It is well known that proper encapsulation is crucial for the lifetime of organic light-emitting-diode (OLED) displays. With the development of increasingly better barrier coatings and perimeter seals, it has now become very desirable to be able to precisely measure the rate of water-vapor and oxygen permeation through barrier coatings and perimeter sealing. This paper demonstrates a new permeation-measurement method that uses tritium-containing water (HTO) as a tracer material. The theoretical detection limit of this direct method is 2.4 x 10(-8) g/(m(2)-day).

引用

页码：569 / 573

页数：5