A new method for measuring ultra-low water-vapor permeation for OLED displays

被引:2
|
作者
Dunkel, R [1 ]
Bujas, R [1 ]
Klein, A [1 ]
Horndt, V [1 ]
机构
[1] Gen Atom Co, San Diego, CA 92121 USA
关键词
OLED; barrier coating; water-vapor permeation;
D O I
10.1889/1.2001214
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is well known that proper encapsulation is crucial for the lifetime of organic light-emitting-diode (OLED) displays. With the development of increasingly better barrier coatings and perimeter seals, it has now become very desirable to be able to precisely measure the rate of water-vapor and oxygen permeation through barrier coatings and perimeter sealing. This paper demonstrates a new permeation-measurement method that uses tritium-containing water (HTO) as a tracer material. The theoretical detection limit of this direct method is 2.4 x 10(-8) g/(m(2)-day).
引用
收藏
页码:569 / 573
页数:5
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