Triboelectrification of active pharmaceutical ingredients: week acids and their salts
被引:3
作者:
Fujinuma, Kenta
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机构:
Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Nippon Chemiphar Co Ltd, Gener Pharmaceut Dev Dept, Misato, Saitama 3410005, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Fujinuma, Kenta
[1
,2
]
Ishii, Yuji
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机构:
Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Ishii, Yuji
[1
]
Yashihashi, Yasuo
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机构:
Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Yashihashi, Yasuo
[1
]
Yonemochi, Estuo
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机构:
Hoshi Univ, Sch Pharm & Pharmaceut Sci, Shinagawa Ku, Tokyo 1428501, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Yonemochi, Estuo
[3
]
Sugano, Kiyohiko
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机构:
Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Sugano, Kiyohiko
[1
]
Tarada, Katsuhide
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机构:
Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, JapanToho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
Tarada, Katsuhide
[1
]
机构:
[1] Toho Univ, Fac Pharmaceut Sci, Funabashi, Chiba 2748510, Japan
[2] Nippon Chemiphar Co Ltd, Gener Pharmaceut Dev Dept, Misato, Saitama 3410005, Japan
[3] Hoshi Univ, Sch Pharm & Pharmaceut Sci, Shinagawa Ku, Tokyo 1428501, Japan
Triboelectrification;
Active pharmaceutical ingredient;
Weak acid;
Sodium salt;
Zero-charge margin;
Standard carrier beads;
ELECTRIFICATION;
MICRONIZATION;
POWDERS;
SURFACE;
D O I:
10.1016/j.ijpharm.2015.08.008
中图分类号:
R9 [药学];
学科分类号:
1007 ;
摘要:
The effect of salt formulation on the electrostatic property of active pharmaceutical ingredients was investigated. The electrostatic property of weak acids (carboxylic acids and amide-enole type acid) and their sodium salts was evaluated by a suction-type Faraday cage meter. Free carboxylic acids showed negative chargeability, whereas their sodium salts showed more positive chargeability than the free acids. However, no such trend was observed for amide-enole type acids. (C) 2015 Elsevier B.V. All rights reserved.
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Han, Xi
;
Ghoroi, Chinmay
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机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Ghoroi, Chinmay
;
To, Daniel
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
To, Daniel
;
Chen, Yuhua
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h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Chen, Yuhua
;
Dave, Rajesh
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Han, Xi
;
Ghoroi, Chinmay
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Ghoroi, Chinmay
;
To, Daniel
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
To, Daniel
;
Chen, Yuhua
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA
Chen, Yuhua
;
Dave, Rajesh
论文数: 0引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USANew Jersey Inst Technol, New Jersey Ctr Engineered Particulates, Newark, NJ 07102 USA