Bismuth on copper(110): Analysis of the c(2x2) and p(4x1) structures by surface X-ray diffraction

被引:7
作者
Lottermost, L
Buslaps, T
Johnson, RL
Feidenhansl, R
Nielson, M
Smilgies, D
Landemark, E
Meyerheim, HL
机构
[1] RISO NATL LAB,DK-4000 ROSKILDE,DENMARK
[2] UNIV MUNICH,INST KRISTALLOG & MINERAL,D-80333 MUNICH,GERMANY
关键词
bismuth; copper; low index single crystal surfaces; metallic surfaces; surface relaxation and reconstruction; surface structure; morphology; roughness; and topography; X-ray scattering; diffraction; and reflection;
D O I
10.1016/S0039-6028(96)01151-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Surface X-ray diffraction has been used to analyze the atomic structures of the Cu(110)-c(2 x 2)-Bi and Cu(110)-p(4 x 1)-Bi reconstructions with submonolayer coverages. A quasi-hexagonal c(2 x 2) adlayer structure is formed when half a monolayer of bismuth is deposited; the coverage corresponds to 1.08 x 10(-15) atoms cm(-2). There is one Bi atom per c(2 x 2) surface unit cell, and the nearest-neighbor distance on the planar overlayer was found to be 4.43 Angstrom. In the case of the p(4 x 1) reconstruction formed at a coverage of 0.75 monolayers, both the in-plane and out-of-plane data are in excellent agreement with a model in which every fourth Cu row in the [001] direction of the topmost layer is replaced by Bi atoms to form a substitutional surface alloy. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:11 / 20
页数:10
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