Theoretical investigation of the off-axis z-scan technique for nonlinear optical refraction measurement

被引：7
|
作者：
Ryasnyansky, AI [1 ]
Palpant, B
机构：
[1] Samarkand State Univ, Samarkand 703004, Uzbekistan
[2] Univ Paris 06, CNRS, Inst Nanosci Paris, F-75015 Paris, France
来源：
APPLIED OPTICS | 2006年 / 45卷 / 12期
关键词：
D O I：
10.1364/AO.45.002773
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The theoretical investigation of the off-axis z-scan technique for the measurement of nonlinear optical refraction in materials is presented. The normalized transmittance is calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude (Delta T-PV) and the distance between maximum and minimum (Delta z(PV)) on the aperture radius is analyzed. A condition for the applicability of the pinhole approximation is given. (c) 2006 Optical Society of America.
引用
收藏
页码：2773 / 2776
页数：4
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