An ultrastable and robust single-photon emitter in hexagonal boron nitride

被引:23
作者
Liu, Wei [1 ,2 ]
Wang, Yi-Tao [1 ,2 ]
Li, Zhi-Peng [1 ,2 ]
Yu, Shang [1 ,2 ]
Ke, Zhi-Jin [1 ,2 ]
Meng, Yu [1 ,2 ]
Tang, Jian-Shun [1 ,2 ]
Li, Chuan-Feng [1 ]
Guo, Guang-Can [1 ,2 ]
机构
[1] Univ Sci & Technol China, CAS Key Lab Quantum Informat, Hefei, Peoples R China
[2] Univ Sci & Technol China, CAS Ctr Excellence Quantum Informat & Quantum Phy, Hefei, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
Hexagonal boron nitride; Single photon emitter; van der Waals materials; Photostability; QUANTUM EMITTERS; POINT-DEFECTS; EMISSION; ADHESION; EXCITONS;
D O I
10.1016/j.physe.2020.114251
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Quantum emitters in van der Waals (vdW) materials have attracted lots of attentions in recent years, and shown great potentials to be fabricated as quantum photonic nanodevices. Especially, the single photon emitter (SPE) in hexagonal boron nitride (hBN) emerges with the outstanding room-temperature quantum performances, whereas the ubiquitous blinking and bleaching restrict its practical applications and investigations critically. The blister in vdW materials possessing stable structure can modify the local bandgap by strains on nanoscale, which is supposed to have the ability to fix this photostability problem. Here we report a blister-induced high-purity SPE in hBN under ambient conditions showing stable quantum-emitting performances, and no evidence of blinking and bleaching for one year. Remarkably, we observe the nontrivial successive activating and quenching dynamical process of the fluorescent defects at the SPE region under low pressures for the first time, and the robust recoverability of the SPE after turning back to the atmospheric pressure. The pressure tuned performance indicates the SPE origins from the lattice defect isolated and activated by the strain induced from the blister, and sheds lights on the future high-performance quantum sources based on hBN.
引用
收藏
页数:8
相关论文
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