Ab initio structural predictions for ultrathin aluminum oxide films on metallic substrates

被引:83
作者
Jennison, DR [1 ]
Verdozzi, C [1 ]
Schultz, PA [1 ]
Sears, MP [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
D O I
10.1103/PhysRevB.59.R15605
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
On several metallic substrates, first-principles density-functional calculations of Al2O3 5-7 Angstrom films predict a structure, stabilized by interfacial electrostatics, which has no bulk counterpart. In two and three O-layer films, Al ions prefer distorted tetrahedral sites, over the normal octahedral sites. The film/substrate interface is found to consist of strongly chemisorbed oxygen and is the determining factor in geometry; these oxygens are only weakly perturbed by the presence of Al2O3 overlayers. In an experimentally relevant film (two O layers, as on NiAl), Al ions are nearly coplanar with surface O ions; thus observing "oxygen termination'' does not indicate a polar surface. As a test case, we find Pt overlayers bind similarly as to alpha-Al2O3, suggesting these films may indeed be useful models for thicker materials. [S0163-1829(99)50524-9].
引用
收藏
页码:15605 / 15608
页数:4
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