Quality Control by Artificial Vision

被引：2
|
作者：
Pinoli, Jean-Charles [1 ]
Panetta, Karen [2 ]
Hata, Seiji [3 ]
机构：
[1] Ecole Natl Super Mines, LPMG Lab, UMR CNRS 5148, F-42023 St Etienne 2, France
[2] Tufts Univ, Dept Elect & Comp Engn, Medford, MA 02155 USA
[3] Kagawa Univ, Fac Engn, Takamatsu, Kagawa 7608526, Japan
来源：
JOURNAL OF ELECTRONIC IMAGING | 2012年 / 21卷 / 02期
关键词：
D O I：
10.1117/1.JEI.21.2.021101
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
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