Optical properties of GaAsBi/GaAs quantum wells: Photoreflectance, photoluminescence and time-resolved photoluminescence study

被引:33
作者
Kopaczek, J. [1 ]
Linhart, W. M. [1 ]
Baranowski, M. [1 ]
Richards, R. D. [2 ]
Bastiman, F. [2 ]
David, J. P. R. [2 ]
Kudrawiec, R. [1 ]
机构
[1] Wroclaw Univ Technol, Fac Fundamental Problems Technol, PL-50370 Wroclaw, Poland
[2] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
关键词
bismuth; photoreflectance; photoluminescence; dilute bismide; MOLECULAR-BEAM EPITAXY; CARRIER LOCALIZATION; GROWTH; ORIGIN; GAP;
D O I
10.1088/0268-1242/30/9/094005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Photoreflectance (PR), photoluminescence (PL) and time-resolved PL were applied to study the optical properties, particularly the localized and delocalized states and carrier dynamics, in GaAs1-xBix/GaAs quantum wells. With increasing Bi concentration the ground state transition (i.e., the transition between the first heavy hole and the first electron subband) red shifts due to Bi-related reduction of the GaAs1-xBix energy gap. Additionally, the transition related to the excited states in the quantum wells is clearly observed for the sample with high Bi concentration of 5.6%, confirming these quantum wells are type I. The PL measurements show the S-shape behavior and indicate the strong localization effect below 150 K for all measured samples, while the PL emission above 150 K is related to delocalized states. The localized character of emission at low temperatures is confirmed by time-resolved PL studies. At 10 K the decay time has strong spectral dispersion (i.e. the decay time increases from similar to 10 ns to similar to 400 ns going from the high to low energy side of the PL peak). This dispersion disappears above 190 K. At room temperature the decay time is in the order of a few ns.
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页数:7
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