共 53 条
- [1] [Anonymous], IEDM
- [4] Interface engineering for enhanced electron mobilities in W/HfO2 gate stacks [J]. IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2004, TECHNICAL DIGEST, 2004, : 825 - 828
- [5] CARTIER E, 2005, INT S VLSI TECHN KYO
- [6] CHAN V, 2005, CUST INT CIRC C SAN
- [7] Extremely scaled silicon nano-CMOS devices [J]. PROCEEDINGS OF THE IEEE, 2003, 91 (11) : 1860 - 1873
- [9] CHEN TC, 2006, INT SOL STAT CIRC C