A TEST OF THICK-TARGET NONUNIFORM IONIZATION AS AN EXPLANATION FOR BREAKS IN SOLAR FLARE HARD X-RAY SPECTRA

被引:18
作者
Su, Yang [1 ,2 ,3 ]
Holman, Gordon D. [1 ]
Dennis, Brian R. [1 ]
Tolbert, Anne K. [1 ,4 ]
Schwartz, Richard A. [1 ,2 ]
机构
[1] NASA, Goddard Space Flight Ctr, Solar Phys Lab, Greenbelt, MD 20771 USA
[2] Catholic Univ Amer, Dept Phys, Washington, DC 20064 USA
[3] Purple Mt Observ, Nanjing 210008, Peoples R China
[4] Wyle IS, Mclean, VA 22102 USA
关键词
Sun: chromosphere; Sun: flares; Sun:; X-rays; gamma rays; ELECTRON-SPECTRA; ENERGY CUTOFF; BREMSSTRAHLUNG; RHESSI; MICROWAVE; EMISSION; BURSTS; BEAMS;
D O I
10.1088/0004-637X/705/2/1584
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
Solar nonthermal hard X-ray (HXR) flare spectra often cannot be fitted by a single power law, but rather require a downward break in the photon spectrum. A possible explanation for this spectral break is nonuniform ionization in the emission region. We have developed a computer code to calculate the photon spectrum from electrons with a power-law distribution injected into a thick target in which the ionization decreases linearly from 100% to zero. We use the bremsstrahlung cross section from Haug, which closely approximates the full relativistic Bethe-Heitler cross section, and compare photon spectra computed from this model with those obtained by Kontar et al., who used a step-function ionization model and the Kramers approximation to the cross section. We find that for HXR spectra from a target with nonuniform ionization, the difference (Delta gamma) between the power-law indexes above and below the break has an upper limit between similar to 0.2 and 0.7 that depends on the power-law index d of the injected electron distribution. A broken power-law spectrum with a higher value of Delta gamma cannot result from nonuniform ionization alone. The model is applied to spectra obtained around the peak times of 20 flares observed by the Ramaty High-Energy Solar Spectroscopic Imager from 2002 to 2004 to determine whether thick-target nonuniform ionization can explain the measured spectral breaks. A Monte Carlo method is used to determine the uncertainties of the best-fit parameters, especially on Delta gamma. We find that 15 of the 20 flare spectra require a downward spectral break and that at least six of these could not be explained by nonuniform ionization alone because they had values of Delta gamma with less than a 2.5% probability of being consistent with the computed upper limits from the model. The remaining nine flare spectra, based on this criterion, are consistent with the nonuniform ionization model.
引用
收藏
页码:1584 / 1593
页数:10
相关论文
共 27 条
[1]   Fast spectral fitting of hard X-ray bremsstrahlung from truncated power-law electron spectra [J].
Brown, J. C. ;
Kasparova, J. ;
Massone, A. M. ;
Piana, Michele .
ASTRONOMY & ASTROPHYSICS, 2008, 486 (03) :1023-1029
[2]  
Brown J. C., 1996, Astronomical Society of the Pacific Conference Series, V111, P292
[4]   THICK TARGET X-RAY BREMSSTRAHLUNG FROM PARTIALLY IONIZED TARGETS IN SOLAR-FLARES [J].
BROWN, JC .
SOLAR PHYSICS, 1973, 28 (01) :151-158
[5]   Inversion of thick-target bremsstrahlung spectra from nonuniformly ionised plasmas [J].
Brown, JC ;
McArthur, GK ;
Barrett, RK ;
McIntosh, SW ;
Emslie, AG .
SOLAR PHYSICS, 1998, 179 (02) :379-404
[6]   CHARACTERISTICS OF HARD X-RAY-SPECTRA OF IMPULSIVE SOLAR-FLARES [J].
DULK, GA ;
KIPLINGER, AL ;
WINGLEE, RM .
ASTROPHYSICAL JOURNAL, 1992, 389 (02) :756-763
[7]   An improved method to derive the lower energy cutoff of non-thermal electrons from hard X-rays of solar flares [J].
Gan, WQ ;
Li, YP ;
Chang, J ;
McTiernan, JM .
SOLAR PHYSICS, 2002, 207 (01) :137-147
[8]  
Haug E, 1997, ASTRON ASTROPHYS, V326, P417
[9]   ELECTRON PITCH ANGLE SCATTERING AND THE IMPULSIVE PHASE MICROWAVE AND HARD X-RAY-EMISSION FROM SOLAR-FLARES [J].
HOLMAN, GD ;
KUNDU, MR ;
PAPADOPOULOS, K .
ASTROPHYSICAL JOURNAL, 1982, 257 (01) :354-360
[10]   The effects of low- and high-energy cutoffs on solar flare microwave and hard X-ray spectra [J].
Holman, GD .
ASTROPHYSICAL JOURNAL, 2003, 586 (01) :606-616