Ionization of hafnium L-shell by electron impact

被引：0

作者：

Luo, ZM ^{[1
]}

Fu, YC ^{[1
]}

An, Z ^{[1
]}

Peng, XF ^{[1
]}

He, FQ ^{[1
]}

Long, XG ^{[1
]}

机构：

[1] Sichuan Univ, Inst Nucl Sci & Technol, Key Lab Radiat Phys & Technol, Educ Minist China, Chengdu 610064, Peoples R China

来源：

CHINESE PHYSICS LETTERS | 2002年 / 19卷 / 11期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A lower-energy electron beam has been directed on to a hafnium thin target with thick backing to investigate the process of L-shell ionization. By using a Si(Li) detector to count the x-rays from the L-subshell, the partial and total production cross sections and mean ionization cross sections versus electron energies have been deduced simultaneously (from threshold to 36keV). The influence of the electron reflected from the backing on measurements has been corrected. The path of the electron multi-scattered in the target itself has also been calculated by using the Monte Carlo programme (EGS4). A comparison with both theoretical predictions is given.

引用

页码：1610 / 1612

页数：3

共 13 条

[1] Correction of substrate effect in the measurement of 8-25-keV electron-impact K-shell ionization cross sections of Cu and Co elements [J].